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The x ray fluorescent or XRF Spectrometers are required for chemical analysis of sediments, minerals, fluids and rocks by using X ray wavelength. The mechanism of these instruments depends on the principle of energy dispersive based X ray fluorescence analysis. These are equipped with ergonomically designed silicon draft detector that possesses outstanding resolution level for error free detection purpose. The necessary measurement scope like software based image computation technique of these instruments is useful for their accurate analysis work. Good repeatability, long working life, uninterrupted operation, adjustable measurement time, energy efficient operation and cutting edge data integration technique are some of the key features of these XRF Spectrometers.